Geometric phase analysis is a digital signal processing method used with Fast Fourier transform algorithms in high-resolution transmission electron microscopy images to quantify displacement and strain fields in crystalline lattices at nanoscale resolution.[1][2]
References
Hytch, M.J. (1998). "Quantitative measurement of displacement and strain fields from HREM micrographs". Ultramicroscopy. 74 (3): 131–146. doi:10.1016/s0304-3991(98)00035-7.
Kumar, Challa S.S.R., ed. (2014). Transmission Electron Microscopy Characterization of Nanomaterials. Springer. ISBN 978-3642389337.
Undergraduate Texts in Mathematics
Graduate Studies in Mathematics
Hellenica World - Scientific Library
Retrieved from "http://en.wikipedia.org/"
All text is available under the terms of the GNU Free Documentation License
